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Properties of metal layers realized with vapour deposition
Milichovský, Miloš ; Švecová, Olga (referee) ; Šandera, Josef (advisor)
This work deals with vacuum evaporation of metals, basic principles of this technology and exploring the properties of the resulting layer. It describes how vacuum evaporation works and its individual parts.The main part deals with evaporation of copper and other substances and the conductivity of the resulting film in relation to its thickness. As a parameter for measuring substrate temperature is specified.
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Preparation of organic semiconducting thin films by vacuum evaporation
Schön, Martin ; David, Jan (referee) ; Salyk, Ota (advisor)
This thesis deals with preparation of organic molecular thin film compounds and its properties like morphology and purity. The vapour deposition was used for thin films preparation, because used materials are very few soluble. Thin films properties were characterized with the infrared spectroscopy (FTIR) and scanning electron microscope. There are described basics of infrared spectroscopy, spectra measurement and interpretation in the theoretical part. Process of thin film preparation is also described in this part. In the experimental part are described used vacuum technology and measuring instruments, process of sample measurement and there is the list of studied materials. 12 derivates of diketopyrrolopyrrols (DPP) were studied in this thesis. Diketopyrrolopyrroles (DPP) and its derivates have interesting chemical and physical properties, expecting wide range of applications, especially in electronics industry.
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Mechanical and Electrical Properties of Thin Metal Films Deposited by Vacuum Evaporation
W. F. Yahya, Doaa ; Kolařík, Vladimír (referee) ; Štencl,, Jiří (referee) ; Šandera, Josef (advisor)
Thin layers are widely used in many fields of technology and today we can say that they are found in all modern technologies. Thin layers can be created in two ways, namely by chemical or physical means. This work focuses on the latter method, more particularly a technology of thermal evaporation of thin layers in a vacuum. The work focuses on the process principles during and after the evaporation. Much of the work focuses on the development and design of experiments. These experiments illustrate some of the phenomena that take place on thin films produced by the aforementioned technology. Work helps to better understand processes during formation of thin layers and properties that influence the quality and stability of thin films. In conclusion we describe results of experiments and new developments in the field of thin films deposition using evaporation under vakuum are summarized.
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Study of thin film organic materials thickness
Hegerová, Lucie ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The diploma thesis deals with the determination of thickness and refractive index of thin organic films using image analysis. In the theoretical part there are described principles of the methods, which are used to prepare the films (spin coating, inkjet printing, vapour deposition), the characteristics of thin films, ways of finding out the thickness and refractive index of substances (weight methods, electric methods, method based on measurement of absorption coefficient of light, interference microscopy, ellipsometry) and also image analysis (harmonic and wavelet analysis). Interference microscope Epival - Interpako (Carl Zeiss Jena), digital camera Nikon Coolpix 5400 and computer were used for the determination of thickness and refractive index. The thicknesses of layers were set on the basis of interference images of edges and grooves – both from the side of the metal contact and the side of underlying glass. The refractive indices of thin layers were then set using the recorded figures. In the final part of the thesis there are discussed the results of interference images photographed along the full length of the aluminium contact which are used for measuring electrical characteristics of DPP structures. The produces are thicknesses and refractive indices of individual layers.
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Morphology study of organic molecular compounds thin films
Schön, Martin ; Vala, Martin (referee) ; Salyk, Ota (advisor)
This thesis deals with morphology study of organic molecular thin film compounds. The vapour deposition was used for thin films preparation. There are described used vacuum technology and measuring instruments in the theoretical part. In the second part is then described the experiment. The characteristics and morphology of thin films have been analyzed by scanning electron microscope (SEM). Influence of deposition temperature and distance between substrate holder and evaporator boat on film morphology have been analyzed. Diketopyrrolopyrrole (DPP) thin films have interesting chemical and physical properties, expecting wide range of applications, especially in electronics industry.
|
|
|
Properties of metal layers realized with vapour deposition
Milichovský, Miloš ; Švecová, Olga (referee) ; Šandera, Josef (advisor)
This work deals with vacuum evaporation of metals, basic principles of this technology and exploring the properties of the resulting layer. It describes how vacuum evaporation works and its individual parts.The main part deals with evaporation of copper and other substances and the conductivity of the resulting film in relation to its thickness. As a parameter for measuring substrate temperature is specified.
|
|
|
Mechanical and Electrical Properties of Thin Metal Films Deposited by Vacuum Evaporation
W. F. Yahya, Doaa ; Kolařík, Vladimír (referee) ; Štencl,, Jiří (referee) ; Šandera, Josef (advisor)
Thin layers are widely used in many fields of technology and today we can say that they are found in all modern technologies. Thin layers can be created in two ways, namely by chemical or physical means. This work focuses on the latter method, more particularly a technology of thermal evaporation of thin layers in a vacuum. The work focuses on the process principles during and after the evaporation. Much of the work focuses on the development and design of experiments. These experiments illustrate some of the phenomena that take place on thin films produced by the aforementioned technology. Work helps to better understand processes during formation of thin layers and properties that influence the quality and stability of thin films. In conclusion we describe results of experiments and new developments in the field of thin films deposition using evaporation under vakuum are summarized.
|
|
|
Preparation of organic semiconducting thin films by vacuum evaporation
Schön, Martin ; David, Jan (referee) ; Salyk, Ota (advisor)
This thesis deals with preparation of organic molecular thin film compounds and its properties like morphology and purity. The vapour deposition was used for thin films preparation, because used materials are very few soluble. Thin films properties were characterized with the infrared spectroscopy (FTIR) and scanning electron microscope. There are described basics of infrared spectroscopy, spectra measurement and interpretation in the theoretical part. Process of thin film preparation is also described in this part. In the experimental part are described used vacuum technology and measuring instruments, process of sample measurement and there is the list of studied materials. 12 derivates of diketopyrrolopyrrols (DPP) were studied in this thesis. Diketopyrrolopyrroles (DPP) and its derivates have interesting chemical and physical properties, expecting wide range of applications, especially in electronics industry.
|
|
|
Study of thin film organic materials thickness
Hegerová, Lucie ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The diploma thesis deals with the determination of thickness and refractive index of thin organic films using image analysis. In the theoretical part there are described principles of the methods, which are used to prepare the films (spin coating, inkjet printing, vapour deposition), the characteristics of thin films, ways of finding out the thickness and refractive index of substances (weight methods, electric methods, method based on measurement of absorption coefficient of light, interference microscopy, ellipsometry) and also image analysis (harmonic and wavelet analysis). Interference microscope Epival - Interpako (Carl Zeiss Jena), digital camera Nikon Coolpix 5400 and computer were used for the determination of thickness and refractive index. The thicknesses of layers were set on the basis of interference images of edges and grooves – both from the side of the metal contact and the side of underlying glass. The refractive indices of thin layers were then set using the recorded figures. In the final part of the thesis there are discussed the results of interference images photographed along the full length of the aluminium contact which are used for measuring electrical characteristics of DPP structures. The produces are thicknesses and refractive indices of individual layers.
|
|
|
Morphology study of organic molecular compounds thin films
Schön, Martin ; Vala, Martin (referee) ; Salyk, Ota (advisor)
This thesis deals with morphology study of organic molecular thin film compounds. The vapour deposition was used for thin films preparation. There are described used vacuum technology and measuring instruments in the theoretical part. In the second part is then described the experiment. The characteristics and morphology of thin films have been analyzed by scanning electron microscope (SEM). Influence of deposition temperature and distance between substrate holder and evaporator boat on film morphology have been analyzed. Diketopyrrolopyrrole (DPP) thin films have interesting chemical and physical properties, expecting wide range of applications, especially in electronics industry.
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